| Issue |
J. Eur. Opt. Soc.-Rapid Publ.
Volume 6, 2011
|
|
|---|---|---|
| Article Number | 11045 | |
| Number of page(s) | 8 | |
| DOI | https://doi.org/10.2971/jeos.2011.11045 | |
| Published online | 07 September 2011 | |
Regular papers
Self calibration of sensorless adaptive optical microscopes
Department of Engineering Science, University of Oxford, Parks Road, Oxford, OX1 3PJ, United Kingdom
Received:
30
May
2011
We present a self-calibrating scheme for microscopes using model-based wavefront sensorless adaptive optics. Unlike previous methods, this scheme permits the calibration of system aberration modes without the need for a separate wavefront sensor or interferometer. Basis modes are derived from the deformable mirror influence functions and an image cross-correlation method is used to remove image displacement effects from these modes. Image based measurements are used to derive an optimum modal representation from the displacement-free basis modes. These new modes are insensitive to system misalignments and the shape of the illumination profile. We demonstrate the effectiveness and robustness of these optimal modes in a third harmonic generation (THG) microscope.
Key words: Adaptive optics / aberrations / microscopy
© The Author(s) 2011. All rights reserved.
Current usage metrics show cumulative count of Article Views (full-text article views including HTML views, PDF and ePub downloads, according to the available data) and Abstracts Views on Vision4Press platform.
Data correspond to usage on the plateform after 2015. The current usage metrics is available 48-96 hours after online publication and is updated daily on week days.
Initial download of the metrics may take a while.