Open Access
Issue
J. Eur. Opt. Soc.-Rapid Publ.
Volume 5, 2010
Article Number 10038s
Number of page(s) 8
DOI https://doi.org/10.2971/jeos.2010.10038s
Published online 01 September 2010
  1. L. Reimer, Image Formation in Low-Voltage Scanning Electron Microscopy (SPIE Optical Engineering Press, Bellingham, 1993). [CrossRef] [Google Scholar]
  2. W. Beil, and I. C. Carlsen, “Surface reconstruction from stereoscopy and shape from shading” in SEM images” Mach. Vision Appl. 4, 271–285 (1991). [NASA ADS] [CrossRef] [Google Scholar]
  3. J. Paluszynski, and W. Slowko, “Surface reconstruction with the photometric method in SEM” Vacuum 78, 533–537 (2005). [NASA ADS] [CrossRef] [Google Scholar]
  4. W. Slowko, and W. Drzazga, “Detection of secondary electrons in a retarding electric field” Vacuum 63, 463–467 (2001). [NASA ADS] [CrossRef] [Google Scholar]
  5. C. Tollkamp, Rekonstruktion des Oberflächenprofils in einem Raster-Elektronenmikroskops mit einem Zwei-Detektor System (Dissertation, Universität Münster, 1984). [Google Scholar]
  6. M. Kässens, and L. Reimer, “Contrast effects using a 2-detector system in low voltage scanning electron microscopy” J. Microsc.-Oxford 181, 277–285 (1996). [CrossRef] [Google Scholar]
  7. J. Cazaux, “Recent developments and new strategies in scanning electron microscopy” J. Microsc.-Oxford 217, 16–35 (2005). [CrossRef] [Google Scholar]
  8. I. Müllerova, and I. Konvalina, “Collection of secondary electrons in scanning electron microscopes” J. Microsc.-Oxford 236, 203–210 (2009). [CrossRef] [Google Scholar]

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