Open Access
Issue |
J. Eur. Opt. Soc.-Rapid Publ.
Volume 4, 2009
|
|
---|---|---|
Article Number | 09012 | |
Number of page(s) | 3 | |
DOI | https://doi.org/10.2971/jeos.2009.09012 | |
Published online | 30 March 2009 |
- N. Harrick, “Semiconductor surface properties deduced from free carrier absorption and reflection of infrared radiation” J. Phys. Chem. Solids 14, 60 (1960). [NASA ADS] [CrossRef] [Google Scholar]
- J. Majewski and D. Matthiesen, “Quantative infrared imaging for measurement of dopant distribution in gallium arsenide” J. Cryst. Growth 137, 249 (1994). [NASA ADS] [CrossRef] [Google Scholar]
- C. Drake, S. Deshpande, and S. Seal, “Determination of free carrier density and space charge layer variation in nanocrystalline In3+ doped tin oxides using Fourier transform infrared spectroscopy” Appl. Phys. Lett. 89, 143116 (2006). [NASA ADS] [CrossRef] [Google Scholar]
- A. J. Huber, F. Keilmann, J. Wittborn, J. Aizpurua, and R. Hillenbrand, “Terahertz Near-Field Nanoscopy of Mobile Carriers in Single Semiconductor Nanodevices” Nano Lett. 8, 3766–3770 (2008). [Google Scholar]
- H. Ito, K. Suizu, T. Yamashita, A. Nawahara, and T. Sato, “Random Frequency Accessible Broad Tunable Terahertz-Wave Source Using Phase-Matched 4-Dimethylamino-N-methyl-4-stilbazolium Tosylate Crystal” Jpn. J. Appl. Phys. 46, 7321 (2007). [CrossRef] [Google Scholar]
- V. Bougrov, M. E. Levinshtein, S. L. Rumyantsev, and A. Zubrilov, Properties of Advanced Semiconductor Materials GaN, AlN, InN, BN, SiC, SiGe (John Wiley & Sons, Inc., New York, 2001). [Google Scholar]
- R. Holm, J. Gibson, and E. Palik, “Infrared reflectance studies of bulk and epitaxial-film n-type GaAs” J. Appl. Phys. 48, 212 (1977). [CrossRef] [Google Scholar]
- A. Barker and M. Ilegems, “Infrared Lattice Vibrations and Free-Electron Dispersion in GaN” Phys. Rev. B 7, 743 (1973). [NASA ADS] [CrossRef] [Google Scholar]
- Y. Fu, M. Willander, Z.-F. Li, and W. Lu, “Electron mobilities, Hall factors, and scattering processes of n-type GaN epilayers studied by infrared reflection and Hall measurements” Phys. Rev. B 67, 113313 (2003). [CrossRef] [Google Scholar]
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