| Issue |
J. Eur. Opt. Society-Rapid Publ.
Volume 21, Number 1, 2025
EOSAM 2024
|
|
|---|---|---|
| Article Number | 16 | |
| Number of page(s) | 8 | |
| DOI | https://doi.org/10.1051/jeos/2025011 | |
| Published online | 08 April 2025 | |
Research Article
Microsphere-assistance in conventional, interference and confocal microscopy – modeling and experimental results
Measurement Technology Group, Faculty of Electrical Engineering and Computer Science, University of Kassel, Wilhelmshöher Allee 71, 34121 Kassel, Germany
* Corresponding author: lucie.hueser@uni-kassel.de
Received:
5
December
2024
Accepted:
5
March
2025
Topographical as well as microscopic imaging of nanoscale surfaces plays a pivotal role across various disciplines. Nevertheless, achieving fast, label-free, and accurate characterization of laterally expanded structures below the diffraction limit remains challenging. Recent studies highlight the use of microsphere assistance for resolution improvement. Confocal, conventional, and interference microscopy, augmented by microspheres, enable the imaging of small structures that were previously inaccessible. In this contribution, results of microsphere-assisted confocal and conventional bright-field microscopy (MAM) are compared to underline the decisive role of the confocal effect. Furthermore, an extensive comparison of simulated confocal results is presented to highlight the experimental results.
Key words: Resolution / Microsphere / Confocal microscopy / Simulation / Microsphere-assisted microscopy
© The Author(s), published by EDP Sciences, 2025
This is an Open Access article distributed under the terms of the Creative Commons Attribution License (https://creativecommons.org/licenses/by/4.0), which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
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