Issue |
J. Eur. Opt. Soc.-Rapid Publ.
Volume 8, 2013
|
|
---|---|---|
Article Number | 13028 | |
Number of page(s) | 5 | |
DOI | https://doi.org/10.2971/jeos.2013.13028 | |
Published online | 15 April 2013 |
Regular papers
Thickness conditions for characterizing the periodic nanostructures with the retrieved electromagnetic parameters
1
Key Laboratory for Micro-/Nano-Optoelectronic Devices of Ministry of Education, College of Information Science and Engineering, Hunan University, Changsha 410082, People’s Republic of China
2
Research Center of Laser Fusion, Chinese Academic of Engineering Physics, Mianyang 621900, People’s Republic of China
* txz@hnu.edu.cn
** scwen@hnu.edu.cn
Received:
23
February
2013
Revised:
26
March
2013
By analyzing the convergence of the retrieved effective electromagnetic parameters, we presented that one wavelength of the propagating wave in the nanostructure is the minimum thickness requirement for effectively characterizing a finite thickness nanostructure. This thickness condition has been separately validated in a photonic crystal with negative refraction and in a typical fishnet metamaterial which has been investigated theoretically and experimentally before.
Key words: Photonic crystal / retrieved electromagnetic parameters / negative refraction
© The Author(s) 2013. All rights reserved.
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