Articles citing this article

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Cited article:

Peter Lehmann, André Stelter, Marco Künne, Tobias Pahl, Felix Rosenthal, Peter J. de Groot, Pascal Picart and Felipe Guzman
13 (2024)
https://doi.org/10.1117/12.3021907

Frequency selective illumination for high aperture coherence scanning interferometry

Marco Künne, Andre Stelter, Tobias Pahl and Peter Lehmann
Measurement Science and Technology 35 (11) 115025 (2024)
https://doi.org/10.1088/1361-6501/ad727d

A novel cubic‐exp evaluation algorithm considering non‐symmetrical axial response signals of confocal microscopes

Sebastian Hagemeier, Tobias Pahl, Johannes Breidenbach and Peter Lehmann
Microscopy Research and Technique 86 (8) 1012 (2023)
https://doi.org/10.1002/jemt.24376

Simultaneous local spectral, colorimetric, and topographic characterization of laser-induced colored stainless steel with low coherence interference microscopy

Sébastien Marbach, Rémy Claveau, Florie Ogor, Christophe Cordier, Jesse Schiffler, Paul Montgomery and Manuel Flury
Optics and Lasers in Engineering 162 107402 (2023)
https://doi.org/10.1016/j.optlaseng.2022.107402

Lateral resolution enhanced interference microscopy using virtual annular apertures

Peter Lehmann, Lucie Hüser, Andre Stelter and Thomas Kusserow
Journal of Physics: Photonics 5 (1) 015001 (2023)
https://doi.org/10.1088/2515-7647/acb249

Investigation of measurement data of low-coherence interferometry at tilted surfaces in the 3D spatial frequency domain

Marco Künne, Sebastian Hagemeier, Eireen Käkel, Hartmut Hillmer and Peter Lehmann
tm - Technisches Messen 89 (7-8) 515 (2022)
https://doi.org/10.1515/teme-2021-0137

Analysis of interference microscopy in the spatial frequency domain

Peter Lehmann, Marco Künne and Tobias Pahl
Journal of Physics: Photonics 3 (1) 014006 (2021)
https://doi.org/10.1088/2515-7647/abda15

Rigorous 3D modeling of confocal microscopy on 2D surface topographies

Tobias Pahl, Sebastian Hagemeier, Jörg Bischoff, Eberhard Manske and Peter Lehmann
Measurement Science and Technology 32 (9) 094010 (2021)
https://doi.org/10.1088/1361-6501/abfd69

Wide-field parallel mapping of local spectral and topographic information with white light interference microscopy

Sébastien Marbach, Rémy Claveau, Fangting Wang, et al.
Optics Letters 46 (4) 809 (2021)
https://doi.org/10.1364/OL.413036

Peter J. de Groot, Xavier Colonna de Lega, Rong Su, Jeremy Coupland, Richard K. Leach, Erik Novak, James D. Trolinger and Christopher C. Wilcox
23 (2021)
https://doi.org/10.1117/12.2595668

Spatially Resolved Optical Characterization of Functional Materials Using Coherence Scanning Interferometry

Paul Christopher Montgomery, Rémy Claveau, Sébastien Marbach and Manuel Flury
physica status solidi (a) 218 (17) (2021)
https://doi.org/10.1002/pssa.202000683

Resolution enhancement through nearfield-assistance in interference microscopy

Lucie Hüser and Peter Lehmann
tm - Technisches Messen 87 (s1) s28 (2020)
https://doi.org/10.1515/teme-2020-0013

Fourier optics modeling of interference microscopes

Peter J. de Groot and Xavier Colonna de Lega
Journal of the Optical Society of America A 37 (9) B1 (2020)
https://doi.org/10.1364/JOSAA.390746

Two-dimensional modelling of systematic surface height deviations in optical interference microscopy based on rigorous near field calculation

Tobias Pahl, Sebastian Hagemeier, Lucie Hüser, Weichang Xie and Peter Lehmann
Journal of Modern Optics 67 (11) 963 (2020)
https://doi.org/10.1080/09500340.2020.1801871

Microsphere-assisted interferometry with high numerical apertures for 3D topography measurements

Lucie Hüser and Peter Lehmann
Applied Optics 59 (6) 1695 (2020)
https://doi.org/10.1364/AO.379222