Open Access
Issue
J. Eur. Opt. Soc.-Rapid Publ.
Volume 9, 2014
Article Number 14053
Number of page(s) 5
DOI https://doi.org/10.2971/jeos.2014.14053
Published online 10 December 2014
  1. J. E. Yellowhair, Advanced technologies for fabrication and test of large flat mirrors (Ph.D. Dissertation, University of Arizona, Tucson, 2007). [Google Scholar]
  2. L. B. Yu, E. Barakat, T. Sfez, L. Hvozdara, J. Di Francesco, and H. Peter Herzig, “Manipulating Bloch surface waves in 2D: a platform concept-based flat lens”, Light Sci. Appl. 3, e124 (2014). [NASA ADS] [CrossRef] [Google Scholar]
  3. S. Zhu, and X. H. Zhang, “Application of error detach technology in Ritchey-Common test for flat mirror”, Opt. Precision Eng. 22, 7–12 (2014). [CrossRef] [Google Scholar]
  4. M. S. Bai, P. Li, J. K. Zhang, and L. Teng, “Improvement on nonuniformity for sphere mirrors with large radius of curvature”, Opt. Precision Eng. 21, 554–560 (2013). [CrossRef] [Google Scholar]
  5. H. Ren, L. Ma, X. Liu, Y. He, W. G. Wan, and R. H. Zhu, “Optical element test with multiple surface interference”, Opt. Precision Eng. 19, 1144–1150 (2013). [CrossRef] [Google Scholar]
  6. X. F. Fan, W. T. Zheng, and D. J. Singh, “Light scattering and surface plasmons on small spherical particles”, Light Sci. Appl. 3, e179, 1–14 (2014). [NASA ADS] [CrossRef] [Google Scholar]
  7. P. Girshovitz, and N. T. Shaked, “Doubling the field of view in off-axis low-coherence interferometric imaging”, Light Sci. Appl. 3, e151, 1–9 (2014) [NASA ADS] [CrossRef] [Google Scholar]
  8. D. Malacala, Optical Shop Testing (Wiley, New York, 2007). [CrossRef] [Google Scholar]
  9. Z. H. Tian, Z. G. Shi, W. Q. Liu, H. J. Yang, and Y. X. Sui, “Highaccuracy measurement for radius of curvature and its uncertainties”, Opt. Precision Eng. 21, 2496–2501 (2013). [Google Scholar]
  10. J. Liu, E. L. Miao, Y. Qi, Y. X. Sui, and H. J. Yang, “Measurement of optical surface based on intensity self-calibration phase-shift algorithm”, Opt. Precision Eng. 22, 2008––2013 (2014) [Google Scholar]
  11. K. L. Shu, “Ray–trace analysis and data reduction methods for the Ritchey–Common test”, Appl. Optics 22(12), 1879–1886 (1983). [NASA ADS] [CrossRef] [Google Scholar]
  12. S. Han, E. Novak, and M. Schurig, “Application of Ritchey-Common test in large flat measurements”, Proc. SPIE 4399, 131–136 (2001) [NASA ADS] [CrossRef] [Google Scholar]
  13. S. Han, E. Novak, and M. Schuring, “Ritchey-Common Test used for Measurement of Astronomical Optic”, Proc. SPIE 4842, 270–273 (2003). [NASA ADS] [CrossRef] [Google Scholar]
  14. ZYGO Corporation, Ritchey-Common Metro-Pro Application [M], (ZYGO Corporation, Connecticut, 2004). [Google Scholar]
  15. S. Zhu, and X. H. Zhang, “Eliminating alignment error and analyzing Ritchey angle accuracy in Ritchey-Common test”, Opt. Commun. 311, 368–374 (2013). [NASA ADS] [CrossRef] [Google Scholar]

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