Figure 22
Download original image
High resolution scan of the writing pattern with 2 μm scan range and 20 nm step size in order to quantify the writing pattern tilt β. While scanning Δz, the fringe movement Δϕ of the fringe pattern is tracked. A functional fit is then applied to determine the gradient of the linear shift of the fringes and therefore to determine β.
Current usage metrics show cumulative count of Article Views (full-text article views including HTML views, PDF and ePub downloads, according to the available data) and Abstracts Views on Vision4Press platform.
Data correspond to usage on the plateform after 2015. The current usage metrics is available 48-96 hours after online publication and is updated daily on week days.
Initial download of the metrics may take a while.