EOSAM 2024
Open Access

Table 3

Parameters for imaging the cross-shaped pattern on the NV centres substrate for two cases.

Parameters Values for Case I Values for Case II
Pixel size 20 nm 10 nm
Pinhole size 1 A.U. 1 A.U.
Dwell time 20 μs 20 μs
Line accumulation 1 1
Excitation power 2% 2%
STED power 5% 5%
Excitation wavelength 561 nm 561 nm
STED wavelength 775 nm 775 nm
Frame size 15 × 15 μm2 15 × 15 μm2

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