EOSAM 2024
Open Access

Table 1

Roughness values of defined, differently prepared fused silica sample surfaces.

Fused silica samples
Rq [μm]
Sample nr. Preparation method Mean value Std. Deviation
1 Polished 0.001 0.000
2 Fine ground D35 0.289 0.038
3 Fine ground D64 0.438 0.130
4 Medium ground D64 0.728 0.134
5 Lapped F400 0.790 0.035
6 Rough ground D64 0.990 0.138
7 Lapped F230 2.177 0.214
8 Rough ground D126 2.966 0.535

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