Figure 8
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Resistance of the MSM structure based on (a) the pure V2O5/FTO film and (b) the TiO2-doped V2O5/FTO film under 20–360 °C; (c) Two devices’ scatter plots and Gauss nonlinear fitting curves of first order derivative of resistance with respect to temperature; (d) The ratio of the resistance changes and (e) the h(λ) (700 nm) of two devices under thermal cycles.
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