| Issue |
J. Eur. Opt. Soc.-Rapid Publ.
Volume 3, 2008
|
|
|---|---|---|
| Article Number | 08026 | |
| Number of page(s) | 6 | |
| DOI | https://doi.org/10.2971/jeos.2008.08026 | |
| Published online | 20 August 2008 | |
Regular papers
Spectral confocal reflection microscopy using a white light source
Department of Engineering Science, University of Oxford, Parks Road, Oxford, OX1 3PJ, United Kingdom
Received:
30
June
2008
We present a reflection confocal microscope incorporating a white light supercontinuum source and spectral detection. The microscope provides images resolved spatially in three-dimensions, in addition to spectral resolution covering the wavelength range 450-650 nm. Images and reflection spectra of artificial and natural specimens are presented, showing features that are not normally revealed in conventional microscopes or confocal microscopes using discrete-line lasers. The specimens include thin film structures on semiconductor chips, iridescent structures in Papilio blumei butterfly scales, nacre from abalone shells and opal gemstones. Quantitative size and refractive index measurements of transparent beads are derived from spectral interference bands.
Key words: confocal microscopy / supercontinuum / reflection / spectrometry
© The Author(s) 2008. All rights reserved.
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