| Issue |
J. Eur. Opt. Soc.-Rapid Publ.
Volume 3, 2008
|
|
|---|---|---|
| Article Number | 08010 | |
| Number of page(s) | 6 | |
| DOI | https://doi.org/10.2971/jeos.2008.08010 | |
| Published online | 26 February 2008 | |
Regular papers
Towards a new concept for high sensitivity Compton scatter emission imaging
1
ETIS / CNRS UMR 8051 / ENSEA / Université de Cergy-Pontoise, 6 avenue du Ponceau, 95014 Cergy-Pontoise Cedex, France
2
LPTM / CNRS UMR 8089 / Université de Cergy-Pontoise, 2 rue Adolphe Chauvin, 95302 Cergy-Pontoise Cedex, France
3
Geneva University Hospital, Division of Nuclear Medicine, CH-1211 Geneva 4, Switzerland
a mai.nguyen-verger@u-cergy.fr
b clemence.driol@u-cergy.fr
c truong@u-cergy.fr
d habib.zaidi@hcuge.ch
Received:
30
October
2007
A new efficient scheme for imaging gamma-emitting objects is advocated in this work. It is elaborated on the recent idea of collecting data, using a detector equipped with a parallel-hole collimator, from Compton scattered photons to reconstruct an object in three-dimensions. This paper examines a working mode without collimation, which should increase its sensitivity and field of view. To simplify the otherwise complex mathematical formulation, we choose to discuss the image formation process in two-dimensions, which can be implemented with a slit collimator. Comparison with the standard collimated case, via the analysis of the shapes of the respective point spread functions (PSF), shows marked improvements and numerical simulation results, obtained using a brain phantom, support the viability and attractiveness of this new imaging modality.
Key words: Emission imaging / sensitivity / Compton scattering / image formation / image reconstruction
© The Author(s) 2008. All rights reserved.
Current usage metrics show cumulative count of Article Views (full-text article views including HTML views, PDF and ePub downloads, according to the available data) and Abstracts Views on Vision4Press platform.
Data correspond to usage on the plateform after 2015. The current usage metrics is available 48-96 hours after online publication and is updated daily on week days.
Initial download of the metrics may take a while.