Journal of the European Optical Society-Rapid Publications

Refractive index determination of SiO₂ layer in the UV/Vis/NIR range: spectrophotometric reverse engineering on single and bi-layer designs

L. Gao, F. Lemarchand and M. Lequime

J. Eur. Opt. Soc.-Rapid Publ., 8 (2013) 13010

Published online: 31 January 2013

DOI: 10.2971/jeos.2013.13010

L. Gao

F. Lemarchand

M. Lequime

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