Journal of the European Optical Society-Rapid Publications

Surface mapping of carrier density in a GaN wafer using a frequency-agile THz source

Seigo Ohno, Akihide Hamano, Katsuhiko Miyamoto, Chisato Suzuki and Hiromasa Ito

J. Eur. Opt. Soc.-Rapid Publ., 4 (2009) 09012

Published online: 30 March 2009

DOI: 10.2971/jeos.2009.09012

Seigo Ohno

Akihide Hamano

Katsuhiko Miyamoto

Chisato Suzuki

Hiromasa Ito

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