Surface mapping of carrier density in a GaN wafer using a frequency-agile THz sourceSeigo Ohno, Akihide Hamano, Katsuhiko Miyamoto, Chisato Suzuki and Hiromasa ItoJ. Eur. Opt. Soc.-Rapid Publ., 4 (2009) 09012DOI: https://doi.org/10.2971/jeos.2009.09012
