Mn-doped Bi2-xMnxO3 thin films: structural, optical, and dielectric properties for optoelectronic applications | Journal of the European Optical Society-Rapid Publications

Nano-optoelectronics: from novel materials and nanostructures to innovative applications

Open Access

Figure 9

The deduced values involve: (a) refractive index variation with λ, (b) variation of (n² − 1)⁻¹ with (hv)² to estimate E₀ and E_d, (c) the relation between (n² − 1)⁻¹ and (1/λ²) for obtaining S₀ and λ₀, and (d) λ² dependence of n² to calculate ε_L and $\frac{N}{m^{*}}$ $\frac{\mathrm{N}}{{\mathrm{m}}^{\mathrm{*}}}$ for Bi_2-xMn_xO₃ thin films for different Mn concentrations.

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