Mn-doped Bi2-xMnxO3 thin films: structural, optical, and dielectric properties for optoelectronic applications | Journal of the European Optical Society-Rapid Publications

Nano-optoelectronics: from novel materials and nanostructures to innovative applications

Open Access

Figure 1

Characterization of Bi_1-xMn_xO₃ thin films. (a) Full-range XRD patterns show a dominant preferred orientation. (b) A close-up of the primary peak region (27°–30°) shows a constant shift in the 2θ position, indicating a change in the out-of-plane lattice parameter due to the incorporation of varying amounts of Mn.

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