Refractive index determination of SiO2 layer in the UV/Vis/NIR range: spectrophotometric reverse engineering on single and bi-layer designsL. Gao, F. Lemarchand and M. LequimeJ. Eur. Opt. Soc.-Rapid Publ., 8 (2013) 13010DOI: https://doi.org/10.2971/jeos.2013.13010
