Application of the method of auxiliary sources to a defect-detection inverse problem of optical diffraction microscopyMirza Karamehmedović, Mads-Peter Sørensen, Poul-Erik Hansen and Andrei V. LavrinenkoJ. Eur. Opt. Soc.-Rapid Publ., 5 (2010) 10021DOI: https://doi.org/10.2971/jeos.2010.10021
