Precise spectrophotometric method for semitransparent metallic thin-film index determination using interference enhancementRiley Shurvinton, Fabien Lemarchand, Antonin Moreau and Julien LumeauJ. Eur. Opt. Soc.-Rapid Publ., 17 1 (2021) 29DOI: https://doi.org/10.1186/s41476-021-00172-9
