Articles citing this article

The Citing articles tool gives a list of articles citing the current article.
The citing articles come from EDP Sciences database, as well as other publishers participating in CrossRef Cited-by Linking Program. You can set up your personal account to receive an email alert each time this article is cited by a new article (see the menu on the right-hand side of the abstract page).

Cited article:

Diffraction grating parameter retrieval using non-paraxial structured beams in coherent Fourier scatterometry

S Soman, S F Pereira and O El Gawhary
Journal of Optics 24 (3) 034006 (2022)
https://doi.org/10.1088/2040-8986/ac4abb

Electromagnetic scattering beyond the weak regime: Solving the problem of divergent Born perturbation series by Padé approximants

T. A. van der Sijs, O. El Gawhary and H. P. Urbach
Physical Review Research 2 (1) (2020)
https://doi.org/10.1103/PhysRevResearch.2.013308

Analytical calculation on the determination of steep side wall angles from far field measurements

Luca Cisotto, Silvania F Pereira and H Paul Urbach
Journal of Optics 20 (6) 065601 (2018)
https://doi.org/10.1088/2040-8986/aabb59

Amplitude and phase beam shaping for highest sensitivity in sidewall angle detection

Luca Cisotto and H. Paul Urbach
Journal of the Optical Society of America A 34 (1) 52 (2017)
https://doi.org/10.1364/JOSAA.34.000052

Fourier ellipsometry – an ellipsometric approach to Fourier scatterometry

P. Petrik, N. Kumar, M. Fried, B. Fodor, G. Juhasz, S. F. Pereira, S. Burger and H. P. Urbach
Journal of the European Optical Society-Rapid Publications 10 15002 (2015)
https://doi.org/10.2971/jeos.2015.15002

Ferechteh H. Teherani, David C. Look, David J. Rogers, P. Petrik, N. Kumar, E. Agocs, B. Fodor, S. F. Pereira, T. Lohner, Mi. Fried and H. P. Urbach
8987 89870E (2014)
https://doi.org/10.1117/12.2042181

Christophe Gorecki, Anand K. Asundi, Wolfgang Osten, J. Endres, N. Kumar, P. Petrik, M. -. Henn, S. Heidenreich, S. F. Pereira, H. P. Urbach and B. Bodermann
9132 913208 (2014)
https://doi.org/10.1117/12.2052819

Optical scatterometry system for detecting specific line edge roughness of resist gratings subjected to detector noises

Yen-Min Lee, Jia-Han Li, Fu-Min Wang, et al.
Journal of Optics 16 (6) 065706 (2014)
https://doi.org/10.1088/2040-8978/16/6/065706

Experimental and numerical analysis of the super resolution near-field effect on an InSb sample

Alberto C. Assafrao, Nitish Kumar, Arthur J. H. Wachters, Silvania F. Pereira and H. Paul Urbach
Japanese Journal of Applied Physics 53 (4) 042001 (2014)
https://doi.org/10.7567/JJAP.53.042001

Interferometric coherent Fourier scatterometry: a method for obtaining high sensitivity in the optical inverse-grating problem

S Roy, N Kumar, S F Pereira and H P Urbach
Journal of Optics 15 (7) 075707 (2013)
https://doi.org/10.1088/2040-8978/15/7/075707

Phase retrieval between overlapping orders in coherent Fourier scatterometry using scanning

N. Kumar, O. El Gawhary, S. Roy, S. F. Pereira and H. P. Urbach
Journal of the European Optical Society-Rapid Publications 8 13048 (2013)
https://doi.org/10.2971/jeos.2013.13048