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Cited article:

Analysis of Line-Edge Roughness Using EUV Scatterometry

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Applicability of the Debye-Waller damping factor for the determination of the line-edge roughness of lamellar gratings

Analía Fernández Herrero, Mika Pflüger, Jürgen Probst, Frank Scholze and Victor Soltwisch
Optics Express 27 (22) 32490 (2019)
https://doi.org/10.1364/OE.27.032490

Profile reconstruction of periodic interface

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Journal of the Optical Society of America A 31 (5) 1083 (2014)
https://doi.org/10.1364/JOSAA.31.001083

Reconstruction of sub-wavelength features and nano-positioning of gratings using coherent Fourier scatterometry

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Optics Express 22 (20) 24678 (2014)
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Phase retrieval between overlapping orders in coherent Fourier scatterometry using scanning

N. Kumar, O. El Gawhary, S. Roy, S. F. Pereira and H. P. Urbach
Journal of the European Optical Society-Rapid Publications 8 13048 (2013)
https://doi.org/10.2971/jeos.2013.13048