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Applicability of the Debye-Waller damping factor for the determination of the line-edge roughness of lamellar gratings
Analía Fernández Herrero, Mika Pflüger, Jürgen Probst, Frank Scholze and Victor Soltwisch Optics Express 27(22) 32490 (2019) https://doi.org/10.1364/OE.27.032490
Profile reconstruction of periodic interface
Petr Melezhik, Anatoliy Poyedinchuk, Nataliya Yashina and Gérard Granet Journal of the Optical Society of America A 31(5) 1083 (2014) https://doi.org/10.1364/JOSAA.31.001083
Optical characterization of macro-, micro- and nanostructures using polarized light
Phase retrieval between overlapping orders in coherent Fourier scatterometry using scanning
N. Kumar, O. El Gawhary, S. Roy, S. F. Pereira and H. P. Urbach Journal of the European Optical Society-Rapid Publications 8 13048 (2013) https://doi.org/10.2971/jeos.2013.13048
Off-plane diffraction of extreme ultraviolet light caused by line width roughness