Open Access
Table 1
Comparison of GA and BO gamut improvement for different intermediate dielectric layer thicknesses of the reflective samples elaborated by magnetron sputtering. Orange boxes indicate the best sample type identified with each method, the red underlining indicates the best method for a given sample.
| Dielectric thickness | Initial (20 parameter sets) | 400 parameter sets |
Final |
|||||
|---|---|---|---|---|---|---|---|---|
| R | GA | BO | R | GA | BO | |||
| 80 nm | 25884 | 27328 | 30520 | 34787 | 28330 | 32047 | 34787 | |
| (+5.6%) | (+18%) | (+34%) | (+9.4%) | (+24%) | (+34%) | |||
| 100 nm | 41572 | 46211 | 49986 | 53982 | 48904 | 51303 | 54293 | |
| (+11%) | (+20%) | (+30%) | (+18%) | (+23%) | (+31%) | |||
| 120 nm | 45336 | 57808 | 65113 | 65982 | 63406 | 67023 | 66327 | |
| (+13%) | (+14%) | (+15%) | (+14%) | (+15%) | (+15%) | |||
| 140 nm | 41020 | 52047 | 61296 | 74799 | 57689 | 63407 | 74808 | |
| (+13%) | (+15%) | (+18%) | (+14%) | (+15%) | (+18%) | |||
| 160 nm | 43266 | 51245 | 64927 | 69826 | 59336 | 68904 | 69826 | |
| (+12%) | (+15%) | (+16%) | (+14%) | (+16%) | (+16%) | |||
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