J. Eur. Opt. Soc.-Rapid Publ.
Volume 12, Number 1, 2016
|Number of page(s)||9|
|Published online||20 September 2016|
Universal optical setup for phase-shifting and spatial-carrier digital speckle pattern interferometry
School of Instrumentation Science and Opto-electronics Engineering, Beijing Information Science and Technology University, 100192, Beijing, China
2 Department of Mechanical Engineering, Oakland University, 48309, Rochester, MI, USA
Accepted: 13 September 2016
Background: Digital speckle pattern interferometry (DSPI) is a competitive optical tool for full-field deformation measurement. The two main types of DSPI, phase-shifting DSPI (PS-DSPI) and spatial-carrier DSPI (SC-DSPI), are distinguished by their unique optical setups and methods of phase determination. Each DSPI type has its limited ability in practical applications.
Results: We designed a universal optical setup that is suitable for both PS-DSPI and SC-DSPI, with the aim of integrating their respective advantages, including PS-DSPI’s precise measurement and SC-DSPI’s synchronous measurement, improving DSPI's measuring capacity in engineering.
Conclusion: The proposed setup also has several other advantages, including a simple and robust structure, easy adjustment and operation, and versatility of measuring approach.
Key words: Digital speckle pattern interferometry / Phase shift / Spatial carrier / Deformation measurement / Universal optical setup / Digital holographic interferometry
© The Author(s) 2016
Open Access This article is distributed under the terms of the Creative Commons Attribution 4.0 International License (http://creativecommons.org/licenses/by/4.0/), which permits unrestricted use, distribution, and reproduction in any medium, provided you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made.
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